Programmable Probe Station Precise RF Probe Station For Expandable Research And

Product Description:

The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications.

One of the key features of this magnetic probe station is its optical magnification range, which spans from 0.75X to 5X. This allows users to inspect and position samples with exceptional clarity and precision, ensuring accurate measurements and analysis.

When it comes to magnetic field strength, the probe station excels with a maximum capability of 1 Tesla at an air gap of 20mm. This high level of magnetic field strength provides researchers with the necessary conditions to explore and characterize the magnetic properties of their samples effectively.

The probe seat of this station is equipped with 4 groups of DC probes, 1 group of RF probes, and an 8-pin wire-bonded sample seat. This configuration enables users to perform a wide range of tests and measurements, making it ideal for both DC and RF device testing.

In terms of source meter compatibility, the 1D In-Plane Magnetic Field Probe Station is compatible with a variety of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A. This flexibility allows researchers to seamlessly integrate their existing equipment with the probe station for enhanced functionality and convenience.

Another standout feature of this probe station is its sample displacement stage, which offers X-axis adjustable stroke of ±15mm and adjustment sensitivity of 10μm. Additionally, the stage boasts 360-degree electric rotation, providing users with exceptional control and precision when positioning samples for testing and analysis.

With its expandable functions and advanced capabilities, the 1D In-Plane Magnetic Field Probe Station is a valuable tool for researchers and engineers working in the field of magnetic materials and device characterization. Whether you are conducting basic research, device testing, or material analysis, this probe station offers the performance and flexibility you need to achieve reliable and accurate results.

Features:

• Product Name: 1D In-Plane Magnetic Field Probe Station
• Air Gap: Adjustable From 0-80 Mm
• Source Meter: SR830, N5173B, Keithley 6221, Keithley 2182A
• Sample Displacement Stage: X-axis Adjustable Stroke ±15 Mm, Adjustment Sensitivity 10 μm; Taxis 360-degree Electric Rotation
• Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 MT
• Optical Magnification: 0.75 X-5 X

Technical Parameters:

Applications:

Truth Instruments presents the PS1DX-MS In-Plane Magnetic Field Probe Station, designed for precise measurements in the semiconductor industry. This innovative product, originating from China, offers exceptional optical magnification ranging from 0.75X to 5X, ensuring clear and detailed observations during testing.

The magnetic field uniformity of ±1%φ1 mm guarantees accurate and reliable results, crucial for semiconductor research and development. The sample displacement stage of the probe station provides flexibility with an X-axis adjustable stroke of ±15 mm, offering adjustment sensitivity of 10 μm. Additionally, the stage allows for 360-degree electric rotation, enhancing the automated capabilities of the system.

With an adjustable air gap ranging from 0-80 mm, the PS1DX-MS accommodates various sample sizes and configurations, making it a versatile tool for different testing scenarios. The integration of source meters such as SR830, N5173B, Keithley 6221, and Keithley 2182A ensures precise control and measurement of electrical parameters during testing.

Product Application Occasions and Scenarios:

• Characterization of semiconductor devices with in-plane magnetic field requirements
• Automated testing processes in semiconductor research and development labs
• Precision measurements of magnetic field uniformity in semiconductor materials
• Analysis of magnetic properties in thin films and nanostructures
• Evaluation of magnetic field effects on electronic components