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{"title":"Opto Edu A63.7016 Benchtop Tungsten Filament Scanning Electron Microscope, SE","imgUrl":"https:\/\/img.chinax.com\/nimg\/56\/c7\/97acb6fb9944dac6caef0c8e198c-200x200-1\/opto_edu_a63_7016_benchtop_tungsten_filament_scanning_electron_microscope_2c_se.jpg","attrs":{"Brand Name":"CNOEC, OPTO-EDU","Model Number":"A63.7016","Certification":"CE, Rohs","Place of Origin":"China"}}
{"title":"4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco","imgUrl":"https:\/\/img.chinax.com\/nimg\/ff\/df\/514668990adba0d18f5d8ff9b909-200x200-1\/4_5_6nm_high_magnification_scanning_microscope_electron_surface_topography_eco_sem.jpg","attrs":{"Brand Name":"CNOEC, OPTO-EDU","Model Number":"A63.7062","Certification":"CE,","Place of Origin":"China"}}
{"title":"Five Axes Stage Scanning Electron Microscope Lab With Tungsten Heated Electron","imgUrl":"https:\/\/img.chinax.com\/nimg\/3f\/8b\/0f17dc7608db095909234e126ac5-200x200-1\/five_axes_stage_scanning_electron_microscope_lab_with_tungsten_heated_electron_gun.jpg","attrs":{"Brand Name":"OPTO-EDU","Model Number":"A63.7062","Certification":"CE, Rohs","Place of Origin":"China"}}
{"title":"1x~3000000x Scanning Optical Microscope Digital Five Axis Motorized Stage A63","imgUrl":"https:\/\/img.chinax.com\/nimg\/05\/e5\/eddcc548b5b9f674198b7b6e3d73-200x200-1\/1x_7e3000000x_scanning_optical_microscope_digital_five_axis_motorized_stage_a63_7081.jpg","attrs":{"Brand Name":"OPTO-EDU","Model Number":"A63.7081","Certification":"CE, Rohs","Place of Origin":"China"}}
{"title":"OPTO-EDU A63.7235 High-Throughput Field Emission Scanning Electron Microscope","imgUrl":"https:\/\/img.chinax.com\/nimg\/92\/71\/30ce7587903d04a379b8e1e128f7-200x200-1\/opto_edu_a63_7235_high_throughput_field_emission_scanning_electron_microscope_12kv_600000x.jpg","attrs":{"Brand Name":"CNOEC, OPTO-EDU","Model Number":"A63.7230","Certification":"CE, Rohs","Place of Origin":"China"}}
{"title":"Opto Edu A50.7098 Plunge Freezing Sample Preparation System for Scanning","imgUrl":"https:\/\/img.chinax.com\/nimg\/10\/ef\/48cbb8332bd31508153f1c216124-200x200-1\/opto_edu_a50_7098_plunge_freezing_sample_preparation_system_for_scanning_electric_microscope.jpg","attrs":{"Brand Name":"CNOEC, OPTO-EDU","Model Number":"A50.7098","Certification":"CE, Rohs","Place of Origin":"China"}}
{"title":"Opto Edu A62.4503 Atomic Force Microscope with 50\u03bcm Scan Range 0.2nm Resolution","imgUrl":"https:\/\/img.chinax.com\/nimg\/11\/fb\/46caf29198031daaf1bd62aafcad-200x200-1\/opto_edu_a62_4503_atomic_force_microscope_with_50_ce_bcm_scan_range_0_2nm_resolution_and_0_6hz_7e4_34hz_scan_rate_for_laboratory_r.jpg","attrs":{"Brand Name":"CNOEC, OPTO-EDU","Model Number":"A62.4503","Certification":"CE, Rohs","Place of Origin":"China"}}
Opto Edu A63.7016 Benchtop Tungsten Filament Scanning Electron Microscope
SE+BSE+EDS, 100000x magnification
Advanced Analytical Performance
The A63.7016 SuperSEM breaks tradition with real-time EDS elemental analysis, combining SEM and EDS technologies in an advanced electron optical system. With exceptional analytical performance, real-time energy-dispersive spectroscopic pseudo-color imaging, and user-friendly operation, it enables in-depth analysis of both surface structure and chemical elements of samples.
A63.7016 SuperSEM Key Features
Always display X-ray spectra in real-time
Real-time Energy Dispersive Spectroscopy (EDS) Pseudo-color Imaging
Highlight elements of interest during analysis
Technology Overview
The scanning electron microscope uses an electron beam as the illumination source, irradiating samples with a focused, fine electron beam in a raster scanning manner. This generates various information related to sample properties, which is collected and processed to obtain magnified images of microscopic morphology. Compared to optical or transmission microscopes, it offers high resolution, large depth of field, and three-dimensional imaging capabilities.
Performance Advantages
Fast Scanning Speed: Signal acquisition bandwidth up to 10M. Video mode allows real-time sample observation without ghosting or trailing, ensuring no detail is missed.
Compact Design: Structurally efficient device requires no special equipment rooms or additional vibration isolation tables. Plug-and-play with standard mains power, suitable for limited laboratory space.
Advanced Coloring Technique: SEM image coloring visually highlights sample details, enhancing feature recognition and facilitating analysis. Color differentiation can reveal material composition, improving research outcomes.
Real-time Spectral Comparison: Quantitative results display in real-time without completing collection, allowing comparison with previous spectra during the collection process.
Visualized Energy Spectrum Analysis: Freely select analysis ranges for points, lines, or surfaces. Excellent visualization algorithms achieve precise separation of close spectral peaks and display elemental spatial distribution for studying material characteristics.
BSE: High-Sensitivity 4-segment BSE detector SE: Secondary electron detector EDS: Real-time energy spectrum pseudo-color imaging
EDS Parameter
/
Detector type: silicon drift detector Detection area: 30mm² Resolution: 130eV Range of elemental analysis: B-Cf
Image signal
Backscattered electron
Backscattered electron, Self-developed real-time energy spectrum detector, Secondary electron, Mix (Backscattered electron + Secondary electron + Real-time energy spectrum pseudo-color imaging)
Vacuum mode
Standard, Charge-up reduction
Conductor
BSE, Standard, Charge-up reduction
Size(W×L×H)
292 mm×570 mm×515 mm
292 mm×570 mm×515 mm
292 mm×570 mm×515 mm
292 mm×570 mm×515 mm
Weight
55KG
56KG
57KG
66KG
Applications
The A63.7016 SuperSEM is equipped with high acceleration voltage, multi-angle observation capabilities, and supporting data analysis software that enables automatic focusing, quick scanning, and real-time observation of sample element distribution in video mode. It ensures accurate and efficient image acquisition and analysis for materials including metals, ceramics, batteries, coatings, cement, and soft matter, making it a powerful tool for scientific research and industrial testing.
Opto-Edu (Beijing) Co., Ltd.,as one of the leading supplier of optical & educational products from China, we have concentrated in this field for more than 10 years. We have been collecting and supplying different products for our customers all over the world. We have the most ...
Opto-Edu (Beijing) Co., Ltd.,as one of the leading supplier of optical & educational products from China, we have concentrated in this field for more than 10 years. We have been collecting and supplying different products for our customers all over the world. We have the most ...
