| Delivery Time | 5-6weeks |
| Lattice constant | a=12.497 A |
| Molecular formula | Substituted Gd3GasO12 |
| Density | 7.09g/cm3 |
| Materials | SGGG |
| Melting point | 1730°C |
| Reflection coefficient | 1.954 @ 1064nm |
| crystal structure | Cubic crystal system |
| Mohs hardness | 7.5 |
| Growing methods | Czochralski |
| Payment Terms | T/T, Western Union,MoneyGram,Paypal |
| Model Number | SCR-2026-26-02 |
| Brand Name | Crystro |
| Place of Origin | China |
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Product Specification
| Delivery Time | 5-6weeks | Lattice constant | a=12.497 A |
| Molecular formula | Substituted Gd3GasO12 | Density | 7.09g/cm3 |
| Materials | SGGG | Melting point | 1730°C |
| Reflection coefficient | 1.954 @ 1064nm | crystal structure | Cubic crystal system |
| Mohs hardness | 7.5 | Growing methods | Czochralski |
| Payment Terms | T/T, Western Union,MoneyGram,Paypal | Model Number | SCR-2026-26-02 |
| Brand Name | Crystro | Place of Origin | China |
| High Light | SGGG Crystal substrate for epitaxial growth ,Ca-Mg-Zr doped Gadolinium Gallium Garnet ,Bismuth iron garnet thin film material | ||
SGGG Crystal (Ca-Mg-Zr Doped Gadolinium Gallium Garnet), professional substrate material specially applied for epitaxial growth of bismuth iron garnet thin films, high optical uniformity and stable crystal lattice structure for magneto-optical devices.
Gadolinium gallium garnet (GGG) substrates, one of the earliest developed materials for use as substrates, are unsuitable due to their extremely small lattice constants. As a result, SGGG crystals, which use calcium, magnesium, and zirconium as substitution ions, are more suitable as substrates for bismuth-iron garnet epitaxial films.
| Indicator Name | Dimensions or Other Information | Reference Indicators |
| Dimensic | Nominal Size | 3/4inch |
| Diameter (mm) | 3" | 76.20±0.3 |
| 4" | 101.60±0.3 | |
| Thickness (um) | 3" | 630±30 |
| 4" | 800±30 or custom | |
| Crystaloptics | / | (111)±0.1° |
| Lattice constant | / | 12.497±0.003A |
| Position the edges | Main positioning edge | [-110]±2° |
| Sub-position the edges | [-1-12]±2° | |
| Surface Quality | Flatness (degree) | Maximum value minimum value within 80% coverage area center ≤6um |
| TTV | Maximum value - minimum value within 80% coverage area center ≤6um | |
| Dislocations (dislocations) | Within 80% coverage area, center region <10/cm2 | |
| Within 10% of the center area covering 80% of the total surface area | ||
| Other Defects (Extrudedsurface) |
Within 10% of the center area covering 80% of the total surface area |
Key features:
Low fault density.
High consistency in lattice constants.
Typical applications:
The substrate material for BIG magnetoelectric epitaxial films.
Magnetic refrigeration.
Company Details
Business Type:
Manufacturer,Exporter
Year Established:
2016
Total Annual:
1,100,000-1,500,000
Employee Number:
110~120
Ecer Certification:
Verified Supplier
Anhui Crystro Crystal Materials Co., Ltd. is specialized in research and development of crystal science and technology,we located at Anhui Province,Hefei City. Our business scope mainly concentrated in high-tech crystal materials research and development, manufacture and m... Anhui Crystro Crystal Materials Co., Ltd. is specialized in research and development of crystal science and technology,we located at Anhui Province,Hefei City. Our business scope mainly concentrated in high-tech crystal materials research and development, manufacture and m...
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