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XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.

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China 4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials
China 4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials

  1. China 4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials

4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials

  1. MOQ: 1-10,000pcs
  2. Price: By Case
  3. Get Latest Price
Payment Terms T/T
Supply Ability 10,000 wafers/month
Delivery Time 5-50 working days
Packaging Details Packaged in a class 100 clean room environment, in single container, under a nitrogen atmosphere
Item PAM-FS-GAN100-U
product name Freestanding GaN Substrates
specification 4inch
Dimension Φ100mm ±1mm
Thickness 500-650 µm
other name GaN Wafer
Brand Name PAM-XIAMEN
Place of Origin China

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  1. Product Details
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Product Specification

Payment Terms T/T Supply Ability 10,000 wafers/month
Delivery Time 5-50 working days Packaging Details Packaged in a class 100 clean room environment, in single container, under a nitrogen atmosphere
Item PAM-FS-GAN100-U product name Freestanding GaN Substrates
specification 4inch Dimension Φ100mm ±1mm
Thickness 500-650 µm other name GaN Wafer
Brand Name PAM-XIAMEN Place of Origin China
High Light gallium nitride wafergallium nitride gan

 

4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials

 

PAM-XIAMEN has established the manufacturing technology for freestanding (Gallium Nitride)GaN substrate wafer which is for UHB-LED and LD. Grown by hydride vapour phase epitaxy (HVPE) technology,Our GaN substrate has low defect density and less or free macro defect density.

 

PAM-XIAMEN offers full range of GaN and Related III-N Materials including GaN substrates of various orientations and electrical conductivity,crystallineGaN&AlN templates, and custom III-N epiwafers.

 

Here Shows Detail Specification:

4inch Freestanding GaN Substrates

Item PAM-FS-GaN100-U
Dimension Φ100mm ±1mm
Thickness 500-650 µm
Useable Surface Area > 90%
Orientation C-plane(0001)
Orientation Flat (1-100) ±0.50,30±1mm
Secondary Orientation Flat (11-20)±30,15±1mm
TTV(Total Thickness Variation) ≤50µm
Conduction Type Undoped
Resistivity (300K) < 0.5 Ω·cm
Dislocation Density Less than 5x106cm-2
Surface Roughness:

Front side: Ra<0.2nm, epi-ready;

Back side: Fine Ground or polished.

Package each in single wafer container, under nitrogen atmosphere, packed in class 100 clean room

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

4inch Freestanding GaN Substrates

The growing demand for high-speed, high-temperature and high power-handling capabilities has made the semiconductor industry rethink the choice of materials used as semiconductors. For instance, as various faster and smaller computing devices arise, the use of silicon is making it difficult to sustain Moore’s Law. But also in power electronics, the properties of silicon are no longer sufficient to allow further improvements in conversion efficiency.

 

Due to its unique characteristics (high maximum current, high breakdown voltage, and high switching frequency), Gallium Nitride (or GaN) is the unique material of choice to solve energy problems of the future. GaN based systems have higher power efficiency, thus reducing power losses, switch at higher frequency, thus reducing size and weight.

 

Zinc Blende crystal structure

    Remarks Referens
Energy gaps, Eg 3.28 eV 0 K Bougrov et al. (2001)
Energy gaps, Eg 3.2 eV 300 K
Electron affinity 4.1 eV 300 K
Conduction band      
Energy separation between Γ valley and X valleys EΓ 1.4 eV 300 K Bougrov et al. (2001)
Energy separation between Γ valley and L valleys EL 1.6 ÷ 1.9 eV 300 K
Effective conduction band density of states 1.2 x 1018 cm-3 300 K
Valence band    
Energy of spin-orbital splitting Eso 0.02 eV 300 K
Effective valence band density of states 4.1 x 1019 cm-3 300 K

Band structure for Zinc Blende GaN

Band structure of zinc blende(cubic) GaN. Important minima of the conduction band and maxima of the valence band.
300K; Eg=3.2 eVeV; EX= 4.6 eV; EL= 4.8-5.1 eV; Eso = 0.02 eV
For details see Suzuki, Uenoyama & Yanase (1995) .


 

Brillouin zone of the face centered cubic lattice, the Bravais lattice of the diamond and zincblende structures.

 

Company Details

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 from Quality China Factory
  • Business Type:

    Manufacturer,Exporter,Seller

  • Year Established:

    1990

  • Total Annual:

    10 Million-50 Million

  • Employee Number:

    50~100

  • Ecer Certification:

    Active Member

  Xiamen Powerway Advanced Material Co.,Limited(PAM-XIAMEN) is a high-tech enterprise for compound semiconductor material integrating semiconductor crystal growth, process development and epitaxy, specializing in the research and production of compound semiconductor wafers, there are two mai...   Xiamen Powerway Advanced Material Co.,Limited(PAM-XIAMEN) is a high-tech enterprise for compound semiconductor material integrating semiconductor crystal growth, process development and epitaxy, specializing in the research and production of compound semiconductor wafers, there are two mai...

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  • XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.
  • #506B, Henghui Business Center, No.77, Lingxia Nan Road, High Technology Zone, Huli, Xiamen 361006, China
  • http://www.ganwafer.com/

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