Sireda Technology Co., Ltd.
| Pitch | ≥0.3mm |
| Bandwidth | 80G |
| Pin Count | 2-2000+ |
| Compatible Packages: | BGA, QFN, LGA, SOP, WLCSP |
| Socket Type | Open Top, Clamshell, ATE, etc. |
| Conductor Type | Probe Pins, Pogo Pin, PCR |
| Brand Name | Sireda |
| Model Number | Open Top |
| Certification | ISO9001 |
| Place of Origin | China |
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Product Specification
| Pitch | ≥0.3mm | Bandwidth | 80G |
| Pin Count | 2-2000+ | Compatible Packages: | BGA, QFN, LGA, SOP, WLCSP |
| Socket Type | Open Top, Clamshell, ATE, etc. | Conductor Type | Probe Pins, Pogo Pin, PCR |
| Brand Name | Sireda | Model Number | Open Top |
| Certification | ISO9001 | Place of Origin | China |
| High Light | Rubber Elastomer Socket ，Durable Elastomer Connector ，Durable Elastomer Socket | ||
Non-Destructive BGA Test Sockets | 25GHz High-Speed & Quick-Swap Design
Hybrid Elastomer Matrix Self-healing conductive layers maintain stable contact through thermal cycling (-40°C to +125°C)
Tool-Free Maintenance
Modular design enables full contact grid replacement in under 2 minutes
Universal Compatibility
Adaptable for BGA, QFN, CSP, and PoP test sockets (custom configurations available)
Zero Ball Damage
Compression force controlled within 20-25g/ball (vs. 30g+ industry standard)
| Property | Parameter | Typical Value |
| Mechanical | Insertion Cycles | ≥30K–50K cycles |
|
| Contact Force | 15~25g/pin |
|
| Operating Temperature | Commercial -40 ~ +125 |
|
| Tolerance | ±0.01mm |
| Electrical | Contact Resistance | <50mΩ |
|
| Impedance | 50Ω (±5%) |
|
| Current | 1.5A~3A |
Our elastomeric test sockets offer the perfect balance of performance, durability, and ease of use, ensuring accurate testing while protecting your ICs. Whether you need high-frequency testing for 5G/RF applications, ultra-fine pitch probing, or long-term burn-in reliability, our gentle-contact, low-maintenance design reduces costs and extends the life of your test setup.
✔ No damage to solder balls or pads – Precision force distribution protects your ICs
✔ Long-lasting – 100K+ test cycles with minimal performance degradation
✔ Easy maintenance – Swap contact pins in minutes, no special tools required
✔ High-frequency capable – Reliable signal integrity up to 25GHz
✔ Universal compatibility – Works with BGA, QFN, CSP, PoP & more
Need a custom solution? Contact us today to discuss your IC testing needs—we specialize in bespoke test socket designs for advanced semiconductor applications.
Company Details
Business Type:
Manufacturer
Year Established:
2010
Total Annual:
10000000-50000000
Employee Number:
101~120
Ecer Certification：
Verified Supplier
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