HUATEC GROUP CORPORATION
| Packaging Details | in carton |
| Supply Ability | 50sets per month |
| Resolution | High-definition display, resolution 1280*800 |
| Network Interface | Supports Wi-Fi connection |
| Product name | ACFM Inspection Instrument |
| Operating System | Android OS(based on Linux kernel) |
| Payment Terms | L/C,T/T |
| Storage | 32GB internal storage,expandable up to 128GB |
| Delivery Time | 7~10 working days after payment |
| Display | 7-inch multi-touch display with backlight support |
| Model Number | ACFM |
| Brand Name | HUATEC |
| Place of Origin | China |
| Certification | ISO,CE |
View Detail Information
Explore similar products
NDT Non Destructive Testing Equipment , TG4500 Series Ultrasonic Thickness Gauge
Black NDT Non Destructive Testing Equipment , High Voltage Porosity Detector
SPY Holiday Detector Test / Non Destructive Testing Equipment for Pipe Corrosion
Non Destructive Testing Equipment , Wire Rope Inspection Steel Rope Flaw
Product Specification
| Packaging Details | in carton | Supply Ability | 50sets per month |
| Resolution | High-definition display, resolution 1280*800 | Network Interface | Supports Wi-Fi connection |
| Product name | ACFM Inspection Instrument | Operating System | Android OS(based on Linux kernel) |
| Payment Terms | L/C,T/T | Storage | 32GB internal storage,expandable up to 128GB |
| Delivery Time | 7~10 working days after payment | Display | 7-inch multi-touch display with backlight support |
| Model Number | ACFM | Brand Name | HUATEC |
| Place of Origin | China | Certification | ISO,CE |
| High Light | Intelligent ACFM inspection instrument ，ACFM non-destructive testing equipment ，Alternating Current Field Measurement device | ||
Intelligent Alternating Current Field Measurement (ACFM) Inspection Instrument
Applicable Materials--Ferromagnetic and non-ferromagnetic conductive metals, including carbon steel, stainless steel, aluminum,etc
Application Scope--Detection of surface and near-surface defects in metal structures
Applicable Defects---Capable of effectively detecting surface cracks and other linear defects
Inspection Depth---Maximum depth for carbon steel is 3mm; for stainless steel is 5mm; for aluminum is 8mm
Detection Stability---Minimum defect detection rate greater than 90%
Permissible Coating Types---Non-conductive coatings such as paint,epoxy resin, asphalt, etc
|
Scope of Supply |
|
|
Equipment Name |
Intelligent Alternating Current Field Measurement(ACFM) |
|
Quantity |
1 set |
|
Main Inspection Capabilities |
|
|
Applicable Materials |
Ferromagnetic and non-ferromagnetic conductive metals, including carbon steel, stainless steel, aluminum, etc. |
|
Application Scope |
Detection of surface and near-surface defects in metal structures |
|
Applicable Defects |
Capable of effectively detecting surface cracks and other linear defects |
|
Inspection Depth |
Maximum depth for carbon steel is 3mm; for stainless steel is 5mm; for aluminum is 8mm |
|
Detection Sensitivity |
Capable of detecting surface-opening defects as small as 3*0 .5*0.2mm;can detect defects equivalent to those on Magnetic Particle Inspection (MPI) A1 15/100 test piece |
|
Detection Stability |
Minimum defect detection rate greater than 90% |
|
Permissible Coating Types |
Non-conductive coatings such as paint, epoxy resin, asphalt, etc |
|
Permissible Coating Thickness |
Maximum coating thickness ≤5mm; when used with a large coil probe, can inspect coatings up to 10mm thick |
|
Scanning Speed |
Maximum scanning speed ≤ 60mm/s, minimum scanning speed should be > 5mm/s |
|
Can perform inspections at temperatures up to 500°C when paired with a high--temperature probe |
|
|
Instrument Requirements |
|
|
Display |
7-inch multi-touch display with backlight support |
|
Resolution |
High-definition display, resolution 1280*800 |
|
RAM |
4GB, expandable to 8GB |
|
Storage |
32GB internal storage,expandable up to 128GB |
|
Operating System |
Android OS(based on Linux kernel) |
|
Interfaces |
1*USB3.0/USB2.0 HOST port, 1*Type-C port (charging only) |
|
Network Interface |
Supports Wi-Fi connection; expandable to support 4G dongle |
|
Charging Interface |
Type-C port, integrated with FCP input/output fast charging protocol, AFC input/output fast charging protocol, DRP Try. class="lazy" src="/myres/images/load_icon.gif" data-original protocol, PD3.1 input/output fast charging protocol, QC2.0/QC3.0/QC3.0+ output fast charging protocol |
|
Maximum Charging/Discharging Power:45W |
|
Software Function Requirements:
1. Features parameter recommendation function, suggesting suitable probes and parameters based on set inspection object information
2. Features instrument sensitivity adjustment function, allowing calibration using standard test blocks
Features defect depth coefficient calibration function, allowing depth coefficient setting using reference test blocks
3. Features excitation adjustment function, allowing adjustment of inspection frequency and excitation level based on the inspection object, with automatic adjustment of instrument gain
4. Inspection interface vertical axis supports switching between follow mode and fixed mode, adjustable at any time
5. Features inspection image zoom function, allowing manual zoom and horizontal dragging for result viewing
6. Features image reset function, allowing one-click restoration of zoomed or dragged images
7. Supports inspection image replay function for multiple reviews
8. Features marking function. Clicking the mark button during inspection adds dividers to the inspection image for segmented display in reports
9. Supports defect sizing function. After identifying a defect, selecting its area allows calculating defect length based on encoder data. Surface opening defect depth can be calculated based on Bx signal variation
10. Supports custom inspection report formats and report export function
11. Supports viewing inspection reports, images, and data from historical project files
Basic Configuration
Host Unit: 1unit
Signal Acquisition and Analysis Software:1 set
Pencil Probe:1 unit
Standard Probe (with encoder):1 unit
Probe Connection Cable:1 unit
Charger:1 set
Product User Manual:1 set
Quality Documentation: 1 set
Instrument Case:1 set
Three-Element Array Probe: Optional
Instrument Requirements
Maximum Operating Time:16 hours
Host Dimensions:225mm* 172mm*76mm
Weight:<2.1kg
Operating Temperature:-10° C to 40°C
Operating Humidity:<90% relative air humidity
Hardware Function Requirements
1. Supports multiple probe types, including pencil probe and standard probe
2. Supports conventional multi-element array probes (Optional)
3. Supports high-temperature probe with synchronous temperature compensation function (Optional)
4. Supports encoder for real-time recording of spatial displacement during inspection
5. Can display Bx signal plan view, Bz signal plan view,butterfly diagram, and gradient diagram
6. Supports adjustable inspection frequency, range 1kHz-10kHz
7. Supports adjustable signal intensity, either automatic or manual adjustment
8. Supports hot-swapping of probes, allowing probe changes during inspection
9. Supports hot-swapping and disconnection of the encoder
10. Supports probe button function: Buttons on the probe can control software scanning functions (e.g., start, stop, refresh)
Company Details
Business Type:
Manufacturer,Distributor/Wholesaler,Exporter,Seller
Year Established:
2007
Total Annual:
500000-1000000
Employee Number:
35~50
Ecer Certification：
Verified Supplier
HUATEC Group is a reliable manufacturer and supplier of testing instruments in Beijing China. HUATEC Group combines all the R/D and production advantage of all its own subsidiaries, takes advantage of its years marketing and sales experience in global market, contributes to offering most qualified... HUATEC Group is a reliable manufacturer and supplier of testing instruments in Beijing China. HUATEC Group combines all the R/D and production advantage of all its own subsidiaries, takes advantage of its years marketing and sales experience in global market, contributes to offering most qualified...
Get in touch with us
Leave a Message, we will call you back quickly!