Rohde Schwarz ZNB40 Vector Network Analyzer VNA with 100 kHz to 40 GHz Frequency

The R&S ZNB40 is the widest-range member of the Rohde & Schwarz ZNB vector network analyzer family. Covering 100 kHz to 40 GHz with 2.92 mm test ports, it is engineered for mobile radio, consumer electronics, aerospace and defense development, high-speed printed board design, and the production and service of RF components such as amplifiers, mixers, filters, connectors and cables.

The instrument pairs a dynamic range of up to 135 dB at a 10 Hz IF bandwidth with trace noise below 0.004 dB RMS at 10 kHz IFBW, so deep stop-band measurements and high-blocking duplex filter tests keep their margin while sweep speed stays high. A 401-point frequency sweep completes in about 4 ms, and sampling runs at better than 1 µs per point. Temperature stability of typically 0.01 dB/°C means a full 2-port calibration can stay valid for days without recalibration.

• 100 kHz to 40 GHz coverage with 2.92 mm connectors, available as a 2-port or 4-port analyzer.
• Up to 135 dB dynamic range at 10 Hz IF bandwidth, ideal for high-blocking DUTs such as base station duplex filters.
• Low trace noise: below 0.004 dB RMS at 10 kHz IF bandwidth.
• Fast sweeps: approximately 4 ms for 401 points, sampling faster than 1 µs per point, better than 5 µs per point overall measurement speed.
• Wide output power range: up to +10 dBm, electronically adjustable over more than 70 dB, from about -60 dBm to +10 dBm, for linear and nonlinear amplifier analysis.
• IF bandwidths from 1 Hz to 10 MHz, selectable in 1, 1.5, 2, 3, 5, 7 and 10 steps for the best speed and dynamic range trade-off.
• Excellent raw performance: directivity better than 30 dB and uncorrected test port match up to 30 dB before any calibration.
• Long calibration intervals: typical temperature stability of 0.01 dB/°C and outstanding long-term stability.
• Complete calibration suite with wizards: TOSM, TRL/LRL, TRM and UOSM, manual or automatic with the R&S ZN-Z54 calibration unit. UOSM cuts calibration steps from 14 down to 7.
• Four-port capabilities: differential and frequency-converting measurements on the 4-port model.
• Time domain analysis (K2): distance-to-fault location, gating, filter adjustment, and extended time domain with simultaneous eye diagrams and frequency/time domain traces.
• Frequency converting measurements: K4 frequency conversion and K14 intermodulation options enable harmonics, IM products, conversion loss, matching and isolation tests on mixers and amplifiers with two independent internal sources.
• Amplifier test support: four DC inputs for DC power consumption and efficiency, stability factor measurement for balanced and unbalanced amplifiers, and R&S NRP-Zxx power sensor support.
• Up to 100,000 points per trace: measures electrically long DUTs such as long cables without wrapping.
• Prediction function: virtually extends the frequency range by a factor of up to 10, giving resolution beyond the 40 GHz upper limit.
• 12.1 inch WXGA colour touchscreen: drag and drop traces between diagrams, more than 100 channels and traces, preloaded setups on tabs, undo/redo for the last six entries, soft panel and context-sensitive help.
• Production ready: optional GPIB with bidirectional data transfer during the next sweep, handler I/O for external parts handlers, and RFFE GPIO interface for direct control of mobile front-end modules.
• Modular, upgradeable design: DC inputs, GPIB, power supply, controller and hard disk are plug-in units, and the analyzer emulates the remote control command sets of other Rohde & Schwarz analyzers for easy retrofit.
• Multilingual user interface: English, French, Spanish, Russian, Chinese and more.

• Development, production and service of RF amplifiers, mixers, filters, connectors and cables
• Base station duplex filter and high-blocking DUT testing where 110 dB dynamic range must be measured in under 30 ms
• Mobile radio, consumer electronics, aerospace and defense RF front-end verification
• High-speed printed circuit board and cable characterization, plus distance-to-fault cable testing with time domain gating
• Differential device measurement on the 4-port model, including mixed-mode S-parameters
• On-wafer and in-fixture measurements using TRL/LRL, TRM or UOSM calibration
• Mixer and converter conversion loss, matching and isolation tests with the frequency conversion option
• Automated production test with handler I/O and GPIB bidirectional data transfer