multi force microscopy for materials science

{"cid":"91224222","title":"All-in-One Detection Platform \u2013 Custom Modules & Multi-Force Microscopy For Materials Science","imgUrl":"https:\/\/img.chinax.com\/nimg\/6d\/2f\/f753440c6e7fbaf456d0914f6905-200x200-1.jpg","attrs":{"Brand Name":"Truth Instruments","Model Number":"AtomEdge Pro","Place Of Origin":"CHINA","Working Mode":"Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-directional Scanning Mode","Scanning Range":"100 \u03bcm\u00d7100 \u03bcm\u00d710 \u03bcm","Sample Size":"25 mm","Image Sampling Point":"The Maximum Resolution Of The Scanning Probe Image Is 4096\u00d74096","Nonlinearity":"0.15% In The XY Direction And 1% In The Z Direction","Scanning Rate":"0.1-30 Hz","Multifunctional Measurement":"Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), Force Curve","Scanning Method":"XYZ Three-axis Full Sample Scanning"}}

{"cid":"91191829","title":"KYKY Field Emission Scanning Electron Microscope \/ Scanning Electron Microscopy Instrumentation","imgUrl":"https:\/\/img.chinax.com\/nimg\/9a\/2f\/e7d3e1940ffb0a71e74f93449060-200x200-1.jpg","attrs":{"Brand Name":"KYKY","Model Number":"EM8010","Place of Origin":"China","Certification":"CE","Resolution":"SE 1.5nm@15kV BSE 3nm@30kV","Magnification":"1x-600000x","Accelerating Voltage":"0.2kV-30kV","Max Specimen Diameter":"175mm"}}