thin film moke system

{"cid":"91224222","title":"High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization","imgUrl":"https:\/\/img.chinax.com\/nimg\/7a\/09\/c2172f2df894e9f045b459ea32a4-200x200-1.jpg","attrs":{"Price":"Price Negotiable | Contact us for a detailed quote","Brand Name":"Truth Instruments","Model Number":"Wafer-MOKE","Place Of Origin":"CHINA","Payment Terms":"T\/T","Kerr Angle Resolution":"0.3 Mdeg (RMS)","Testing Efficiency":"12 WPH@\u00b11.3 T \/9 Sites Measurement\/200 mm Wafer","Uptime":"90%","Magnetic Field":"Vertical \u00b12.4 T; In-plane \u00b11.3 T","EFEM":"Optional","Testing Functions":"Non-destructive Hysteresis Loop Measurement Of Magnetic Stacks\/devices, Automatic Extraction Of Hysteresis Loop Information (free Layer And Pinned Layer Hc, Hex, M (Kerr Angle Value)), And Rapid Mapping Of Wafer Magnetic Characteristic Distribution","Magnetic Field Resolution":"PID Closed-loop Feedback Regulation, 0.01 mT","Magnetic Field Uniformity":"Better Than \u00b11%@\u03a61 mm"}}