Changzhou Tonghui Electronic Co., Ltd,
| Application | Semiconductor |
| Data Analysis | Real-time Analysis |
| Data Storage | Internal Memory |
| Data Transfer | USB/Ethernet |
| Dimensions | Compact |
| Display | LCD Display |
| Interface | USB/Ethernet |
| Measurement Range | High Voltage |
| Measurement Speed | High Speed |
| Measurement Type | CV |
| Power Supply | AC/DC |
| Product Name | CV Analyzer for semiconductor |
| Safety | CE/UL Certified |
| Software | Windows/Mac OS |
| Weight | Lightweight |
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Product Specification
| Application | Semiconductor | Data Analysis | Real-time Analysis |
| Data Storage | Internal Memory | Data Transfer | USB/Ethernet |
| Dimensions | Compact | Display | LCD Display |
| Interface | USB/Ethernet | Measurement Range | High Voltage |
| Measurement Speed | High Speed | Measurement Type | CV |
| Power Supply | AC/DC | Product Name | CV Analyzer for semiconductor |
| Safety | CE/UL Certified | Software | Windows/Mac OS |
| Weight | Lightweight | ||
| High Light | semiconductor parameter analyzer ，lcr analyzer ，semiconductor analyser | ||
Application in Testing and Characterization: The DC Bias Current Source finds extensive use in testing and characterization of electronic components, such as transistors, diodes, integrated circuits (ICs), and sensors. It enables the assessment of device behavior under specific biasing conditions, facilitating the measurement of parameters like gain, linearity, leakage current, and threshold voltage. Additionally, it is employed in the calibration of measurement equipment, ensuring accurate and traceable results.
10.1-inch capacitive touch screen, resolution 1280*800, Linux system
Dual CPU architecture, the fastest test speed of LCR function is 0.56ms
Three test methods: spot test, list scan, and graphic scan (option)
Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen
CV curve scan, Ciss-Rg curve scan
Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC
Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel can be expanded to 6, channel parameters are stored separately
Fast charging, shortens capacitor charging time and enables fast testing
Automatic delay setting
High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V/3000V
10 bin sorting
Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.
Semiconductor material
Wafer, C-V characteristic analysis
Liquid crystal material
Elastic constant analysis
Capacitive element
Capacitor C-V characteristic test and analysis, capacitive sensor test and analysis
| Model | TH511 | TH512 | TH513 | ||||
| Channel | 2 (4/6 Ch Optional) | 2 | |||||
| Display | Display | 10.1-inch capacitive touchscreen | |||||
| Ratio | 0.672916667 | ||||||
| Resolution | 1280*RGB*800 | ||||||
| Test Parameter | Ciss, Coss, Crss, Rg. Four parameter selectable arbitrarily | ||||||
| Test Frequency | Range | 1kHz-2MHz | |||||
| Accuracy | 0.0001 | ||||||
| Resolution | 10mHz1.00000kHz-9.99999kHz | ||||||
| 100mHz10.0000kHz-99.9999kHz | |||||||
| 1Hz100.000kHz-999.999kHz | |||||||
| 10Hz1.00000MHz-2.00000MHz | |||||||
| Test Level | Voltage Range | 5mVrms-2Vrms | |||||
| Accuracy | ± (10%*Setting Value+2mV) | ||||||
| Resolution | 1mVrms5mVrms-1Vrms | ||||||
| 10mVrms1Vrms-2Vrms | |||||||
| Vgs | Range | 0 - ±40V | |||||
| Accuracy | 1%* Setting Voltage+8mV | ||||||
| Resolution | 1mV0V - ±10V | ||||||
| 10mV10V - ±40V | |||||||
| Vds | Range | 0 - 200V | 0 - 1500V | 0 - 3000V | |||
| Accuracy | 1%* Setting Voltage+100mV | ||||||
| Output Impedance | 100, ±2%@1kHz | ||||||
| Computation | Absolute deviation from nominal value, percent deviation from nominal value % | ||||||
| Calibration Function | OPEN, SHORT, LOAD | ||||||
| Measure Average | 1-255 times | ||||||
| AD Conversion Time (ms/time) | Fast+: 0.56ms (＞5kHz), Fast: 3.3ms, Middle: 90ms, Slow: 220ms. | ||||||
| Basic Accuracy | 0.001 | ||||||
Company Details
Business Type:
Manufacturer
Year Established:
1994
Total Annual:
10000000-100000000
Employee Number:
500~1000
Ecer Certification：
Active Member
Overview Changzhou Tonghui Electronic Co. Ltd. was founded in 1994. It is a provincial high-tech enterprise integrating R&D, manufacturing and marketing. It is located in the National Development Zone – Changzhou Hi-tech Industry Development Zone with super... Overview Changzhou Tonghui Electronic Co. Ltd. was founded in 1994. It is a provincial high-tech enterprise integrating R&D, manufacturing and marketing. It is located in the National Development Zone – Changzhou Hi-tech Industry Development Zone with super...
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