Truth Instruments Co., Ltd.
Products
Manufacturer of a wide range of products which include Multifunctional Atomic Force Microscope,Wafer-Level Atomic Force Microscoperoscope,Basic-type Atomic Force Microscope,etc
MOQ: 1
Price: Price Negotiable | Contact us for a detailed quote
| Payment Terms | T/T |
| Name | AFM Atomic Force Microscopy |
| Scanning Method | XYZ three-axis full sample scanning |
| Scanning Range | 100 μm x100 μmx 10 μm |
| Scanning Rate | 0.1-30 Hz |
| Noise Level in The XY Direction | 0.4 nm |
| Noise Level in The Z Direction | 0.04 nm |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
| Place of Origin | CHINA |
MOQ: 1
Price: Price Negotiable | Contact us for a detailed quote
| Payment Terms | T/T |
| Name | Atomic Force Microscopes |
| Scanning Angle | 0~360" |
| Scanning Range | Maximum 100μm * 100μm * 910μm |
| Sample Size | Compatible with 8-inch wafers and below |
| Multi-Function Measurement | EFM,KFM,PFM,MFM |
| Scan Speed | 0.1Hz-30Hz |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
| Place of Origin | CHINA |
MOQ: 1
Price: Price Negotiable | Contact us for a detailed quote
| Payment Terms | T/T |
| Brand Name | Truth Instruments |
| Model Number | AtomExplorer |
| Certification | / |
| Place of Origin | CHINA |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Payment Terms | T/T |
| Name | Atomic Force Microscope |
| Noise Level in The XY Direction | 0.4 nm |
| Nonlinearity | 0.02% In The XY Direction And 0.08% In The Z Direction |
| Scanning Rate | 0.1-30 Hz |
| Scanning Range | 100 μm X100 μmx 10 μm |
| Noise Level in The Z Direction | 0.04 nm |
| Sample Size | 25 mm |
| Scanning Method | XYZ Three-axis Full Sample Scanning |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Payment Terms | T/T |
| Name | High Scanning Force Microscope |
| Scanning Modes | Contact, Tapping, Non-contact |
| Model | AFM |
| Imaging Modes | Topography, Phase, Friction, Lateral Force |
| Scan Range | 100 μm X 100 μm |
| Resolution | 0.15 nm |
| Force Resolution | 0.15 NN |
| Software Compatibility | Windows |
| Sample Size | Up To 200 mm X 5200mm |
| Brand Name | Truth Instruments |
| Model Number | Atommax |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Name | Atomic Force Microscope |
| Scanning Rate | 0.1-30 Hz |
| Scanning Method | XYZ Three-axis Full Sample Scanning |
| Scanning Range | 100 μm X100 μmx 10 μm |
| Noise Level in The Z Direction | 0.04 nm |
| Sample Size | 25 mm |
| Noise Level in The XY Direction | 0.4 nm |
| Nonlinearity | 0.02% In The XY Direction And 0.08% In The Z Direction |
| Payment Terms | T/T |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Payment Terms | T/T |
| Name | Atomic Force Microscope |
| Resolution | 0.15 nm |
| Scanning Range | 100 μm X 100 μm X 10 μm |
| Imaging Modes | Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, Phase Imaging |
| Sample Size | Up To 200 mm |
| Probe Type | Silicon, Diamond, Gold, Platinum, Carbon Nanotube |
| Scanning Angle | 0-360° |
| Brand Name | Truth Instruments |
| Model Number | Atommax |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Payment Terms | T/T |
| Name | Atomic Force Microscope |
| Scanning Modes | Contact, Tapping, Non-contact, Lateral Force, Force Modulation |
| Resolution | 0.04 nm |
| Scanning Speed | 0.1Hz-30Hz |
| Sample Stage | Motorized XY Stage With 100 μm Resolution |
| Scanning Range | 100 μm X 100 μm X 10μm |
| Sample Size | Up To 25 mm |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Payment Terms | T/T |
| Name | Atomic Microscope |
| Scanning Speed | 0.1Hz-30Hz |
| Scanning Modes | Contact, Tapping, Non-contact, Lateral Force, Force Modulation |
| Sample Stage | Motorized XY Stage With 100 μm Resolution |
| Sample Size | Up To 25 mm |
| Resolution | 0.04 nm |
| Scanning Range | 100 μm X 100 μm X 10μm |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
MOQ:
Price: Price Negotiable | Contact us for a detailed quote
| Place Of Origin | CHINA |
| Payment Terms | T/T |
| Name | Atomic Force Microscope |
| Sample Stage | Motorized XY Stage With 100 μm Resolution |
| Sample Size | Up To 25 mm |
| Scanning Modes | Contact, Tapping, Non-contact, Lateral Force, Force Modulation |
| Scanning Speed | 0.1Hz-30Hz |
| Scanning Range | 100 μm X 100 μm X 10μm |
| Resolution | 0.04 nm |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
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