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Truth Instruments Co., Ltd.

  • China,Qingdao ,Shandong
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Atomic Force Microscope

Manufacturer of a wide range of products which include Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed,MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For,Nanoscale Potential Atomic Force Mi...

Quality Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed for sale

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Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed

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Payment Terms T/T
Excitation System3 The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe;
Excitation System2 The Uniformity Of The X-axis Magnetic Field Is ≤±1%@2000 Oe@Φ35 Mm Spherical Space;
Excitation System1 The Maximum Magnetic Field Intensity On The X-axis Is ±2000 Oe;
Excitation System4 The Resolution Of The Magnetic Field Monitor Is ≤10 μT
Test Ambient Temperature Module Temperature Overshoot ≤0.5°C
Electric Displacement Stage Module θ-axis Adjustment Range: ±180°; Rotational Accuracy ≤1°; Equipped With An Absolute Position Encoder
Brand Name Truth Instruments
Model Number MCT 500
Place of Origin CHINA

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Quality MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For for sale

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MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For

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Place Of Origin CHINA
Payment Terms T/T
Socket Test Seat Can Withstand Temperatures Ranging From -60°C To 170°C; The Material Is Non-magnetic
Excitation System The Maximum Magnetic Field Intensity On The X-axis Is ±2000 Oe
Electric Displacement Stage Module θ-axis Adjustment Range: ±180°; Rotational Accuracy ≤1°; Equipped With An Absolute Position Encoder
Test Ambient Temperature Module Equipped With A Temperature Monitoring Module, With A Temperature Accuracy Of ≤0.5°C; Temperature Overshoot ≤0.5°C
Temperature Control System The Outlet Temperature Supports A Range Of -70°C To 20°C; The Internal Temperature Range Of The Socket Is -60°C To 170°C
Excitation System4 The Resolution Of The Magnetic Field Monitor Is ≤10 μT
Excitation System2 The Uniformity Of The X-axis Magnetic Field Is ≤±1%@2000 Oe@Φ35 Mm Spherical Space
Excitation System3 The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe
Brand Name Truth Instruments
Model Number MCT 500

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Quality Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution for sale

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Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution

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Place Of Origin CHINA
Payment Terms T/T
Name Atomic Force Microscopy
Sample Stage Piezo-driven XYZ Stage
Imaging Modes Topography, Phase, Friction, Lateral Force, Magnetic Force, Electrostatic Force
Scan Speed 0.1Hz-30Hz
Scanning Range 100 μm X 100 μm X 10 μm
Sample Size Up To 25 Mm
Resolution 0.04nm
Brand Name Truth Instruments
Model Number AtomEdge Pro

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Quality 0.04nm Atomic Force Microscope 0.1Hz - 30Hz AFM Microscope For Precise Nanoscale Surface Analysis for sale

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0.04nm Atomic Force Microscope 0.1Hz - 30Hz AFM Microscope For Precise Nanoscale Surface Analysis

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Place Of Origin CHINA
Payment Terms T/T
Name Atomic Force Microscope
Sample Size Up To 25 Mm
Resolution 0.04nm
Sample Stage Piezo-driven XYZ Stage
Imaging Modes Topography, Phase, Friction, Lateral Force, Magnetic Force, Electrostatic Force
Scanning Range 100 μm X 100 μm X 10 μm
Scan Speed 0.1Hz-30Hz
Brand Name Truth Instruments
Model Number AtomEdge Pro

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Quality High Stability AFM Microscope 0.1 Hz - 30 Hz AFM Systems For Materials Biology And Electronics Imaging for sale

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High Stability AFM Microscope 0.1 Hz - 30 Hz AFM Systems For Materials Biology And Electronics Imaging

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Place Of Origin CHINA
Name AFM Microscope
Scanning Range 100 μm X100 μmx 10 μm
Noise Level in The Z Direction 0.04 Nm
Sample Size 25 Mm
Noise Level in The XY Direction 0.4 Nm
Scanning Rate 0.1-30 Hz
Nonlinearity 0.02% In The XY Direction And 0.08% In The Z Direction
Scanning Method XYZ Three-axis Full Sample Scanning
Payment Terms T/T
Brand Name Truth Instruments
Model Number AtomEdge Pro

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Quality 0.1 Hz - 30 Hz Atomic Force Microscope 0.04 Nm High Precision Microscope With Multiple Modes for sale

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0.1 Hz - 30 Hz Atomic Force Microscope 0.04 Nm High Precision Microscope With Multiple Modes

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Place Of Origin CHINA
Name Atomic Force Microscope
Scanning Rate 0.1-30 Hz
Sample Size 25 Mm
Noise Level in The XY Direction 0.4 Nm
Scanning Method XYZ Three-axis Full Sample Scanning
Nonlinearity 0.02% In The XY Direction And 0.08% In The Z Direction
Scanning Range 100 μm X100 μmx 10 μm
Noise Level in The Z Direction 0.04 Nm
Payment Terms T/T
Brand Name Truth Instruments
Model Number AtomEdge Pro

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Quality Customizable AFM System Scientific Industrial Materials Microscopes With Strong Scalability for sale

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Customizable AFM System Scientific Industrial Materials Microscopes With Strong Scalability

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Place Of Origin CHINA
Name AFM System
Scanning Rate 0.1-30 Hz
Sample Size 25 Mm
Scanning Method XYZ Three-axis Full Sample Scanning
Noise Level in The XY Direction 0.4 Nm
Nonlinearity 0.02% In The XY Direction And 0.08% In The Z Direction
Scanning Range 100 μm X100 μmx 10 μm
Noise Level in The Z Direction 0.04 Nm
Payment Terms T/T
Brand Name Truth Instruments
Model Number AtomEdge Pro

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Quality All In One Atomic Force Microscope Multi Functional Biology Microscopes For Flexible Precise Operation for sale

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All In One Atomic Force Microscope Multi Functional Biology Microscopes For Flexible Precise Operation

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Place Of Origin CHINA
Name Atomic Force Microscope
Scanning Rate 0.1-30 Hz
Scanning Method XYZ Three-axis Full Sample Scanning
Scanning Range 100 μm X100 μmx 10 μm
Noise Level in The Z Direction 0.04 Nm
Sample Size 25 Mm
Noise Level in The XY Direction 0.4 Nm
Nonlinearity 0.02% In The XY Direction And 0.08% In The Z Direction
Payment Terms T/T
Brand Name Truth Instruments
Model Number AtomEdge Pro

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Quality High Scanning Force Microscope 0.15 Nm High Resolution Microscope For Wafe for sale

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High Scanning Force Microscope 0.15 Nm High Resolution Microscope For Wafe

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Place Of Origin CHINA
Payment Terms T/T
Name High Scanning Force Microscope
Scanning Modes Contact, Tapping, Non-contact
Model AFM
Imaging Modes Topography, Phase, Friction, Lateral Force
Scan Range 100 μm X 100 μm
Resolution 0.15 Nm
Force Resolution 0.15 NN
Software Compatibility Windows
Sample Size Up To 200 Mm X 5200mm
Brand Name Truth Instruments
Model Number AtomMax

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Quality Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes for sale

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Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes

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Place Of Origin CHINA
Name Atomic Force Microscope
Noise Level in The XY Direction 0.4 Nm
Nonlinearity 0.02% In The XY Direction And 0.08% In The Z Direction
Scanning Rate 0.1-30 Hz
Scanning Range 100 μm X100 μmx 10 μm
Noise Level in The Z Direction 0.04 Nm
Sample Size 25 Mm
Scanning Method XYZ Three-axis Full Sample Scanning
Payment Terms T/T
Brand Name Truth Instruments
Model Number AtomEdge Pro

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  • Truth Instruments Co., Ltd.
  • 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China
  • https://www.afmmicroscopes.com/

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