All In One Atomic Force Microscope Multi Functional Biology Microscopes For

Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields.

Key Product Attributes:

• Scanning Range: 100 μm X 100 μm x 10 μm
• Noise Level in the Z Direction: 0.04 Nm
• Scanning Method: XYZ Three-axis Full Sample Scanning
• Nonlinearity: 0.02% in the XY Direction and 0.08% in the Z Direction
• Noise Level in the XY Direction: 0.4 Nm

The Atomic Force Microscope stands out with its exceptional scanning range of 100 μm in the X and Y directions, and 10 μm in the Z direction. This wide scanning range allows for detailed and comprehensive imaging of samples at the nanoscale level, providing researchers with valuable insights into surface characteristics and properties.

With a noise level of only 0.04 Nm in the Z direction and 0.4 Nm in the XY direction, the AFM ensures high precision and accuracy in measurements, making it ideal for demanding applications that require reliable data acquisition.

The AFM's scanning method employs XYZ three-axis full sample scanning, enabling users to explore samples from multiple angles and directions with ease. This versatile scanning approach facilitates comprehensive analysis of sample surfaces, making it a valuable tool for a wide range of research applications.

Furthermore, the AFM boasts excellent linearity, with only 0.02% nonlinearity in the XY direction and 0.08% nonlinearity in the Z direction. This high level of linearity ensures that measurements and imaging results are highly accurate and reliable, allowing researchers to confidently interpret their data.

In summary, the Atomic Force Microscope is an all-in-one AFM solution that offers exceptional scanning capabilities, low noise levels, precise scanning methods, and excellent linearity in both the XY and Z directions. With its advanced features and cutting-edge design, the AFM is a must-have tool for researchers and scientists conducting nanoscale electrical measurements and analysis.

Features:

• Product Name: Atomic Force Microscope
• Noise Level in The XY Direction: 0.4 Nm
• Nonlinearity: 0.02% In The XY Direction And 0.08% In The Z Direction
• Scanning Rate: 0.1-30 Hz
• Sample Size: 25 Mm
• Scanning Method: XYZ Three-axis Full Sample Scanning

Technical Parameters:

Applications:

Truth Instruments' Atomic Force Microscope (AFM) model AtomEdge Pro is a state-of-the-art instrument designed to meet the high demands of scientific research and industrial applications. Originating from China, this advanced AFM offers precise measurements and imaging capabilities for a wide range of applications.

The AtomEdge Pro is ideal for various product application occasions and scenarios due to its exceptional features:

• Noise Level: With a noise level of 0.4 Nm in the XY direction, the AtomEdge Pro ensures accurate and reliable measurements even in challenging environments.
• Sample Size: Capable of handling samples up to 25 mm in size, this AFM accommodates a wide range of specimen types for versatile testing.
• Nonlinearity: Offering precision, the AtomEdge Pro boasts low nonlinearity rates of 0.02% in the XY direction and 0.08% in the Z direction, ensuring consistent and accurate results.
• Scanning Rate: With a scanning rate ranging from 0.1 to 30 Hz, users can adjust the speed based on the specific requirements of their experiments.
• Scanning Range: The scanning range of 100 μm x 100 μm x 10 μm provides detailed imaging and measurement capabilities for a wide range of samples.

One of the standout features of the AtomEdge Pro is its ability to operate in Tapping Mode, a popular technique in AFM that minimizes sample damage and provides high-resolution images. This mode is particularly useful in biological and soft material research where gentle imaging is essential.

Whether in research laboratories, academic institutions, or industrial settings, the AtomEdge Pro finds its application in various scenarios:

• Material Science: Studying surface properties, morphology, and mechanical characteristics of materials at the nanoscale.
• Biology: Imaging biological samples such as cells, proteins, and DNA with high resolution and precision.
• Nanotechnology: Characterizing nanomaterials and nanostructures for research and development purposes.
• Quality Control: Ensuring product quality by analyzing surface roughness, defects, and other features at the micro and nanoscale.

With its advanced capabilities and precision engineering, the AtomEdge Pro from Truth Instruments is a reliable and versatile Scanning Force Microscope that caters to the diverse needs of modern research and industry.