Truth Instruments Co., Ltd.
| Payment Terms | T/T |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
| Place of Origin | CHINA |
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Multifunctional Atomic Force Microscope
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Product Specification
| Payment Terms | T/T | Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro | Place of Origin | CHINA |
| High Light | Low-noise Z-axis atomic force microscope ，High-precision nanoscale materials characterization ，Z-axis for AFM nanoscale analysis | ||
The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various techniques such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy, and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements, delivering tailored solutions to particular research fields and creating a highly efficient, multi-purpose inspection platform.
| Item | Specification |
|---|---|
| Sample Size | Compatible with samples with a diameter of 25 mm |
| Scanning Method | XYZ Three-Axis Full-Sample Scanning |
| Scanning Range | 100 μm × 100 μm × 10 μm |
| Scanning Rate | 0.1 Hz - 30 Hz |
| Z-Axis Noise Level | 0.04 nm |
| Nonlinearity | XY Direction: 0.02%; Z Direction: 0.08% |
| Image Sampling Points | 32×32 - 4096×4096 |
| Operating Mode | Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-Directional Scanning Mode |
Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Scanning Capacitive Atomic Force Microscope (Scm), Magnetic Force Microscope (MFM); Optional: Conductive Atomic Force Microscope (C-AFM)
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Maze Domain and Skyrmions in mTJ Stack:SAF/MgO/Ta/Co/Pt)₉ Magnetic Force Microscope(MFM)
Bismuth vanadate thin filmScanning Kelvin Microscope(KPFM)
Perovskite (FAPbI₃) Conductive Atomic ForceMicroscope (C-AFM)
Company Details
Business Type:
Manufacturer
Year Established:
2019
Total Annual:
15.000.000-20.000.000
Employee Number:
100~200
Ecer Certification：
Verified Supplier
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