Truth Instruments Co., Ltd.
| Payment Terms | T/T |
| Name | AFM Atomic Force Microscopy |
| Scanning Method | XYZ three-axis full sample scanning |
| Scanning Range | 100 μm x100 μmx 10 μm |
| Scanning Rate | 0.1-30 Hz |
| Noise Level in The XY Direction | 0.4 nm |
| Noise Level in The Z Direction | 0.04 nm |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
| Place of Origin | CHINA |
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Product Specification
| Payment Terms | T/T | Name | AFM Atomic Force Microscopy |
| Scanning Method | XYZ three-axis full sample scanning | Scanning Range | 100 μm x100 μmx 10 μm |
| Scanning Rate | 0.1-30 Hz | Noise Level in The XY Direction | 0.4 nm |
| Noise Level in The Z Direction | 0.04 nm | Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro | Place of Origin | CHINA |
| High Light | Multi Functional AFM Atomic Force Microscopy ，AFM Atomic Force Microscopy Precise ，Precise Biology Microscope | ||
Multi-Functional Atomic Force Microscope
AtomEdge Pro
The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, featuring strong stability and good scalability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and achieving an efficient detection platform with multiple uses in one machine.
| Sample Size | 25 mm |
| Scanning Method | XYZ three-axis full sample scanning |
| Scanning Range | 100 μm x100 μmx 10 μm |
| Scanning Rate | 0.1-30 Hz |
| Noise Level in The XY Direction | 0.4 nm |
| Noise Level in The Z Direction | 0.04 nm |
| Nonlinearity | 0.15% in the xY direction and 1% in the Z direction |
| lmage Sampling Point | The maximum resolution of the scanning probe image is 4096x4096 |
| Working Mode | Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode |
| Multifunctional Measurement | Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force micro-scope (PFM),magnetic force microscope (MFM), force curve |
Company Details
Business Type:
Manufacturer
Year Established:
2019
Total Annual:
15.000.000-20.000.000
Employee Number:
100~200
Ecer Certification：
Verified Supplier
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