| Payment Terms | T/T |
| Name | Atomic Force Microscopes |
| Scanning Angle | 0~360" |
| Scanning Range | Maximum 100μm * 100μm * 910μm |
| Sample Size | Compatible with 8-inch wafers and below |
| Multi-Function Measurement | EFM,KFM,PFM,MFM |
| Scan Speed | 0.1Hz-30Hz |
| Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro |
| Place of Origin | CHINA |
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Product Specification
| Payment Terms | T/T | Name | Atomic Force Microscopes |
| Scanning Angle | 0~360" | Scanning Range | Maximum 100μm * 100μm * 910μm |
| Sample Size | Compatible with 8-inch wafers and below | Multi-Function Measurement | EFM,KFM,PFM,MFM |
| Scan Speed | 0.1Hz-30Hz | Brand Name | Truth Instruments |
| Model Number | AtomEdge Pro | Place of Origin | CHINA |
| High Light | Wafer Level Atomic Force Microscopes ,Atomic Force Microscopes 0.1Hz ,30Hz Probe Microscope | ||
AtomMax
Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations for laser alignment, probe approach, and scanning parameter adjust.ments.
| Parameter | Specification |
|---|---|
| Sample Size | Compatible with 8-inch wafers and below |
| Scanning Range | Maximum 100μm * 100μm * 910μm |
| Scanning Angle | 0~360" |
| Resolution | Z-axis closed-loop resolution 0.15 nm; X/Y closed-loop resolution 0.5 nm |
| Scanning Probe XY Direction lmage Resolution | Not less than 32x32~4000x4000 |
| Operating Modes | Contact mode, tapping mode, phase imaging mode, lift mode, multi-directional scanning mode |
| Multi-Function Measurement | EFM,KFM,PFM,MFM |
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Company Details
Business Type:
Manufacturer
Year Established:
2019
Total Annual:
15.000.000-20.000.000
Employee Number:
100~200
Ecer Certification:
Verified Supplier
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