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Manufacturer of a wide range of products which include Carrier Concentration Hall Effect Sensor Tester Semiconductor Industry,Semiconductor Materials Hall Effect Sensor Tester Carrier Concentration,Beveling SiC Epitaxial Wafer 150...
MOQ: 1
Price:
| Delivery Time | 8-10week days |
| Feature | easy to carry |
| Product Name | Hall Effect Tester |
| Application | carrier concentration |
| Brand | JDEQ-0001 |
| Performance | stable |
| Industry | semiconductor industry |
| Brand Name | GaNova |
| Model Number | JDEQ-0001 |
| Place of Origin | Suzhou China |
MOQ: 1
Price:
| Delivery Time | 8-10week days |
| Feature | easy to carry |
| Product Name | Hall Effect Tester |
| Application | carrier concentration |
| Brand | JDEQ-0001 |
| Performance | stable |
| Industry | semiconductor industry |
| Brand Name | GaNova |
| Model Number | JDEQ-0001 |
| Place of Origin | Suzhou China |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | SiC Epitaxial Wafer |
| Surface Orientation | Off-Axis:4°toward <11-20>±0.5 ° |
| Polytype | None Permitted |
| Orthogonal Misorientation | ±5.0° |
| Wafer Edge | Beveling |
| Primary Flat Length | 47.5mm ± 1.5mm |
| Brand Name | GaNova |
| Model Number | JDCD03-002-007 |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | SiC Substrate |
| Crystal form | 4H |
| Diameter | 150.0mm+0mm/-0.2mm |
| Surface orientation | Off-Axis:4°toward <11-20>±0.5 ° |
| Primary Flat Length | 47.5mm ± 1.5mm |
| Secondary Flat Length | No Secondary Flat |
| Brand Name | GaNova |
| Model Number | JDCD03-002-007 |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | SiC Epitaxial Wafer |
| Crystal Form | 4H |
| Wafer Edge | Beveling |
| Diameter | 150.0mm +0mm/-0.2mm |
| Surface Orientation | Off-Axis:4°toward <11-20>±0.5 ° |
| Primary Flat Length | 47.5mm ± 1.5mm |
| Brand Name | GaNova |
| Model Number | JDCD03-002-007 |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | Sic Epitaxial Wafer |
| Crystal form | 4H |
| Diameter | 150.0mm+0.0/-0.2mm |
| Surface orientation | {0001}±0.2° |
| Length of main reference edge | Notch |
| Length of secondary reference edge | No sub-reference edges |
| Brand Name | GaNova |
| Model Number | JDCD03-002-005 |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | SiC Epitaxial Wafer |
| Diameter | 150.0mm +0mm/-0.2mm |
| Surface Orientation | Off-Axis:4°toward <11-20>±0.5 ° |
| Primary Flat Length | 47.5mm ± 1.5mm |
| Secondary Flat Length | No Secondary Flat |
| Primary Flat Orientation | Parallel to<11-20>±1° |
| Orthogonal Misorientation | ±5.0° |
| Edge Exclusion | 3mm |
| Brand Name | GaNova |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
| Model Number | JDCD03-002-008 |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | Sic Epitaxial Wafer |
| Crystal form | 4H |
| Diameter | 150.0mm+0.0/-0.2mm |
| Surface orientation | {0001}±0.2° |
| Length of main reference edge | Notch |
| Length of secondary reference edge | No sub-reference edges |
| Brand Name | GaNova |
| Model Number | JDCD03-002-006 |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | SiC Epitaxial Wafer |
| Diameter | 150.0mm +0mm/-0.2mm |
| Surface Orientation | Off-Axis:4°toward <11-20>±0.5 ° |
| Primary Flat Length | 47.5mm ± 1.5mm |
| Secondary Flat Length | No Secondary Flat |
| Primary Flat Orientation | Parallel to<11-20>±1° |
| Orthogonal Misorientation | ±5.0° |
| Edge Exclusion | 3mm |
| Brand Name | GaNova |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
| Model Number | JDCD03-001-003 |
MOQ:
Price:
| Payment Terms | T/T |
| Delivery Time | 3-4 week days |
| Packaging Details | Vacuum packing in a class 10000 clean room environment,in cassettes of 25pcs or single wafer containers. |
| Product Name | Sic Epitaxial Wafer |
| Crystal form | 4H |
| Diameter | 150.0mm+0.0/-0.2mm |
| Surface orientation | {0001}±0.2° |
| Notch orientation | <1-100>±1° |
| Notch angle | 90° +5°/-1° |
| Brand Name | GaNova |
| Model Number | JDCD03-002-009 |
| Certification | UKAS/ISO9001:2015 |
| Place of Origin | Suzhou China |
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